Keyword : thickness

Slit-Mura Detection through Non-contact Optical Measurements of In-Line Spectrometer for TFT-LCDs
Fu-Ming TZU Jung-Hua CHOU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/03/01
Vol. E92-C  No. 3 ; pp. 364-369
Type of Manuscript:  PAPER
Category: Electronic Displays
TFT-LCDslit Muraspectrometerthicknesschromaticity
 Summary | Full Text:PDF(467.3KB)

Practical Design Procedure of an Elliptic Function Dual-Mode Cavity Filter Coupled through a Non-zero-Thick Septum
Toshio ISHIZAKI Koichi OGAWA Hideyuki MIYAKE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/06/25
Vol. E81-C  No. 6 ; pp. 916-923
Type of Manuscript:  Special Section PAPER (Special Issue on Microwave and Millimeter-Wave Module Technology)
Category: Passive Element
dual-modeelliptic function filtercoupling apertureseptumthickness
 Summary | Full Text:PDF(608.4KB)