Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2009/05/01
Vol. E92-C
No. 5 ;
pp. 686-690
Type of Manuscript:
Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category:
Keyword:
AlGaN/GaN HEMTs, current collapse, SiN, passivation film, thermal CVD, |