| Keyword : testing
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Diagnosing Binary Content Addressable Memories with Comparison and RAM Faults Jin-Fu LI | Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D
No. 3 ;
pp. 601-608
Type of Manuscript:
Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Memory Testing Keyword: content addressable memories, testing, diagnosis, march test, | | Summary | Full Text:PDF | |
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Test Generation for SI Asynchronous Circuits with Undetectable Faults from Signal Transition Graph Specification Eunjung OH Jeong-Gun LEE Dong-Ik LEE Ho-Yong CHOI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/06/01
Vol. E84-A
No. 6 ;
pp. 1506-1514
Type of Manuscript:
Special Section PAPER (Special Section on Papers Selected from 2000 International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2000))
Category: Keyword: ATPG, SI asynchronous circuits, signal transition graph, testing, | | Summary | Full Text:PDF | |
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