Keyword : testing and verification


An Analysis of the Economics of the VLSI Development Including Test Cost
Koji NAKAMAE Homare SAKAMOTO Hiromu FUJIOKA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/04/25
Vol. E77-A  No. 4 ; pp. 698-705
Type of Manuscript:  PAPER
Category: Computer Aided Design (CAD)
Keyword: 
testing and verificationeconomics of VLSI developmenttest costVLSI development cycleEB testerFIB reconstructionfault modeling
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The Enhancement of Electromigration Lifetime under High Frequency Pulsed Conditions
Kazunori HIRAOKA Kazumitsu YASUDA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/01/25
Vol. E77-A  No. 1 ; pp. 195-203
Type of Manuscript:  Special Section PAPER (Special Section on Reliability)
Category: Reliability Testing
Keyword: 
fault analysistesting and verificationreliabilityavailability and vulnerability
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Enhanced Unique Sensitization for Efficient Test Generation
Yusuke MATSUNAGA Masahiro FUJITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1993/09/25
Vol. E76-D  No. 9 ; pp. 1114-1120
Type of Manuscript:  Special Section PAPER (Special Issue on Synthesis and Verification of Hardware Design)
Category: Test
Keyword: 
computer hardware and disigntesting and verification
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Analysis of Engine States and Automobile Features Based on Time-Dependent Spectral Characteristics
Yumi TAKIZAWA Shinichi SATO Keisuke ODA Atsushi FUKASAWA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1992/11/25
Vol. E75-A  No. 11 ; pp. 1524-1532
Type of Manuscript:  Special Section PAPER (Special Section on Acoustic System Modeling and Signal Processing)
Category: 
Keyword: 
digital signal processingmodeling and simulationacousticssignals and wavesfault analysistesting and verification
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