Keyword : tester


A Comprehensive Simulation and Test Environment for Prototype VLSI Verification
Kazutoshi KOBAYASHI Hidetoshi ONODERA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3 ; pp. 630-636
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Verification
Keyword: 
simulationtestVLSItesterverification
 Summary | Full Text:PDF

BIST Circuit Macro Using Microprogram ROM for LSI Memories
Hiroki KOIKE Toshio TAKESHIMA Masahide TAKADA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/07/25
Vol. E78-C  No. 7 ; pp. 838-844
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Memory Device, Circuit, Architecture and Application Technologies for Multimedia Age)
Category: 
Keyword: 
memoryBISTROMtestermacro
 Summary | Full Text:PDF