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| Keyword : tester
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A Comprehensive Simulation and Test Environment for Prototype VLSI Verification
Kazutoshi KOBAYASHI Hidetoshi ONODERA | Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D
No. 3 ;
pp. 630-636
Type of Manuscript:
Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Verification
Keyword:
simulation, test, VLSI, tester, verification, | | | Summary | Full Text:PDF | |
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BIST Circuit Macro Using Microprogram ROM for LSI Memories
Hiroki KOIKE Toshio TAKESHIMA Masahide TAKADA | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 1995/07/25
Vol. E78-C
No. 7 ;
pp. 838-844
Type of Manuscript:
Special Section PAPER (Special Issue on LSI Memory Device, Circuit, Architecture and Application Technologies for Multimedia Age)
Category:
Keyword:
memory, BIST, ROM, tester, macro, | | | Summary | Full Text:PDF | |
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