Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2001/06/01 Vol. E84-ANo. 6 ;
pp. 1488-1495 Type of Manuscript: Special Section PAPER (Special Section on Papers Selected from 2000 International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2000)) Category: Keyword: static PLA, testable design, IDDQ test, bridging fault,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1995/07/25 Vol. E78-DNo. 7 ;
pp. 830-838 Type of Manuscript: Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems) Category: Keyword: testable design, fault testing, highly observable condition, circuit conversion,
