Keyword : test vector generation

On Detection of Bridge Defects with Stuck-at Tests
Kohei MIYASE Kenta TERASHIMA Xiaoqing WEN Seiji KAJIHARA Sudhakar M. REDDY 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 683-689
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Defect-Based Testing
defect based testingtest vector generationtest vector modificationbridging faultsfault extraction
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