Keyword : test time


An Optimization Mechanism for Mid-Bond Testing of TSV-Based 3D SoCs
Kele SHEN Zhigang YU Zhou JIANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/02/01
Vol. E99-C  No. 2 ; pp. 308-315
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
core selectiontest timetest costoptimization3D SoC
 Summary | Full Text:PDF

Optimization of Test Accesses with a Combined BIST and External Test Scheme
Makoto SUGIHARA Hiroto YASUURA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/11/01
Vol. E84-A  No. 11 ; pp. 2731-2738
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test
Keyword: 
test timeBISTexternal testCBETtest schedulingtest accesstest busexternal pins
 Summary | Full Text:PDF