Keyword : test structures


Test Structures and a Modified Transmission Line Pulse System for the Study of Electrostatic Discharge
Robert A. ASHTON 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/02/25
Vol. E79-C  No. 2 ; pp. 158-164
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: Device and Circuit Characterization
Keyword: 
integrated electronicssemiconductor materials and devicesESDtest structuresreliability
 Summary | Full Text:PDF

The Application of DOE and RSM Techniques for Wafer Mapping in IC Technology
Anthony J. WALTON Martin FALLON David WILSON 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/02/25
Vol. E79-C  No. 2 ; pp. 219-225
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: Statistical Analysis
Keyword: 
DOERSMwafer mappingtest structuresintegrated circuits
 Summary | Full Text:PDF