Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2011/12/01 Vol. E94-ANo. 12 ;
pp. 2669-2675 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: High-Level Synthesis and System-Level Design Keyword: soft error, hardened design, variability, test structure, shift register,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2005/05/01 Vol. E88-CNo. 5 ;
pp. 796-803 Type of Manuscript: Special Section PAPER (Special Section on Microelectronic Test Structures) Category: Keyword: test structure, 65 nm-node, via chain, OBIRCH, failure analysis,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2002/05/01 Vol. E85-CNo. 5 ;
pp. 1146-1150 Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures) Category: Keyword: test structure, contact resistance, poly-silicon plug, DRAM cell,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2002/05/01 Vol. E85-CNo. 5 ;
pp. 1125-1133 Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures) Category: Keyword: test structure, MOSFET, hot carrier, photoemission,
Advanced Characterization Method for Sub-Micron DRAM Cell Transistors Ikuo KURACHI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1999/04/25 Vol. E82-CNo. 4 ;
pp. 618-623 Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures) Category: Keyword: DRAM, cell transistors, test structure, parameter extraction, parasitic resistance,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1999/04/25 Vol. E82-CNo. 4 ;
pp. 576-581 Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures) Category: Keyword: microelectronics, test structure, offset lithography, linewidth,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/02/25 Vol. E79-CNo. 2 ;
pp. 152-157 Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures) Category: Device and Circuit Characterization Keyword: test structure, MOSFET, linewidth, field step,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/02/25 Vol. E79-CNo. 2 ;
pp. 206-210 Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures) Category: Reliability Analysis Keyword: test structure, very low-level current, atto amperes, measurement technique,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/02/25 Vol. E79-CNo. 2 ;
pp. 192-197 Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures) Category: SOI & Material Characterization Keyword: silicon substrate, crystal defect, TDDB, test structure,
