Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1993/10/25 Vol. E76-ANo. 10 ;
pp. 1730-1737 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: distinguishing sequence, stuck-at fault, sequential circuit, test sequence generation, design rechnique,