Keyword : test sequence generation

Test Sequence Generation for Sequential Circuits with Distinguishing Sequences
Yoshinobu HIGAMI Seiji KAJIHARA Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1993/10/25
Vol. E76-A  No. 10 ; pp. 1730-1737
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
distinguishing sequence, stuck-at fault, sequential circuit, test sequence generation, design rechnique, 
 Summary | Full Text:PDF(696.2KB)
An Optimized Test Sequence Generation Method for Communication Systems--Improved SW Method--
Fumiaki SATO Tadanori MIZUNO 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 1992/10/25
Vol. E75-B  No. 10 ; pp. 1024-1031
Type of Manuscript:  Special Section PAPER (Special Issue on Communication Software Technologies)
Category: 
Keyword: 
communication software, test method, finite state machine, communication protocols, test sequence generation, 
 Summary | Full Text:PDF(634.9KB)