Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/01/01
Vol. E93-D
No. 1 ;
pp. 2-9
Type of Manuscript:
Special Section PAPER (Special Section on Test, Diagnosis and Verification of SOCs)
Category:
Keyword:
power supply noise, test relaxation, X-filling, clock-gating, test compaction, |
