Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2016/12/01 Vol. E99-ANo. 12 ;
pp. 2310-2319 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: at-speed scan testing, IR-drop, capture-power-safety, logic path, clock path, clock stretch, test quality,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2008/03/01 Vol. E91-DNo. 3 ;
pp. 776-780 Type of Manuscript: Special Section LETTER (Special Section on Test and Verification of VLSIs) Category: Keyword: scan test, security, test quality,
