Keyword : test power reduction

A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing
Kohei MIYASE Ryota SAKAI Xiaoqing WEN Masao ASO Hiroshi FURUKAWA Yuta YAMATO Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/09/01
Vol. E96-D  No. 9 ; pp. 2003-2011
Type of Manuscript:  Special Section PAPER (Special Section on Dependable Computing)
Category: 
Keyword: 
at-speed testing, ATPG, IR-drop, test power reduction, low power test, 
 Summary | Full Text:PDF
Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power
Jun LIU Yinhe HAN Xiaowei LI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/08/01
Vol. E93-D  No. 8 ; pp. 2223-2232
Type of Manuscript:  PAPER
Category: Information Network
Keyword: 
selective encoding, test data compression, test power reduction, flexible grouping, X-filling, 
 Summary | Full Text:PDF
Average Power Reduction in Scan Testing by Test Vector Modification
Seiji KAJIHARA Koji ISHIDA Kohei MIYASE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10 ; pp. 1483-1489
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: Test Generation and Modification
Keyword: 
test power reduction, scan testing, ATPG, test modification, 
 Summary | Full Text:PDF