Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2003/12/01
Vol. E86-D
No. 12 ;
pp. 2674-2683
Type of Manuscript:
Special Section PAPER (Special Issue on Dependable Computing)
Category: Test
Keyword:
test plan grouping, test controllers, partly compacted test plan tables, RTL data paths, hierarchical test generation, |
