Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2004/12/01 Vol. E87-ANo. 12 ;
pp. 3318-3323 Type of Manuscript: Special Section LETTER (Special Section on VLSI Design and CAD Algorithms) Category: Test Keyword: BIST, test pattern generator, neighborhood pattern, LFSR, reseeding,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2002/05/01 Vol. E85-DNo. 5 ;
pp. 874-883 Type of Manuscript: PAPER Category: Fault Tolerance Keyword: BIST, test pattern generator, reseeding, bit-flipping, seed generation,
