| Keyword : test generation
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Stuck–Open Fault Detection in CMOS Circuits Using Single Test Patterns Enrico MACII Qing XU | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/11/25
Vol. E77-A
No. 11 ;
pp. 1977-1979
Type of Manuscript:
LETTER
Category: Computer Aided Design (CAD) Keyword: CMOS circuit, stuck–open fault, test generation, | | Summary | Full Text:PDF | |
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