Keyword : test diagnosis


X-Tolerant Test Data Compression for SOC with Enhanced Diagnosis Capability
Gang ZENG Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/07/01
Vol. E88-D  No. 7 ; pp. 1662-1670
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
SOC testingtest cost reductiontest data compressionunknown statetest diagnosis
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