Keyword : test cost


An Area-Efficient Scalable Test Module to Support Low Pin-Count Testing
Tong-Yu HSIEH Tai-Ping WANG Shuo YANG Chin-An HSU Yi-Lung LIN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/03/01
Vol. E99-C  No. 3 ; pp. 404-414
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
low-pin count testingmulti-site testingtest costscalabilityATE utilization
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An Optimization Mechanism for Mid-Bond Testing of TSV-Based 3D SoCs
Kele SHEN Zhigang YU Zhou JIANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/02/01
Vol. E99-C  No. 2 ; pp. 308-315
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
core selectiontest timetest costoptimization3D SoC
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An Analysis of the Economics of the VLSI Development Including Test Cost
Koji NAKAMAE Homare SAKAMOTO Hiromu FUJIOKA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/04/25
Vol. E77-A  No. 4 ; pp. 698-705
Type of Manuscript:  PAPER
Category: Computer Aided Design (CAD)
Keyword: 
testing and verificationeconomics of VLSI developmenttest costVLSI development cycleEB testerFIB reconstructionfault modeling
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