Keyword : test cost

An Area-Efficient Scalable Test Module to Support Low Pin-Count Testing
Tong-Yu HSIEH Tai-Ping WANG Shuo YANG Chin-An HSU Yi-Lung LIN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/03/01
Vol. E99-C  No. 3 ; pp. 404-414
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
low-pin count testing, multi-site testing, test cost, scalability, ATE utilization, 
 Summary | Full Text:PDF(2.8MB)
An Optimization Mechanism for Mid-Bond Testing of TSV-Based 3D SoCs
Kele SHEN Zhigang YU Zhou JIANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/02/01
Vol. E99-C  No. 2 ; pp. 308-315
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
core selection, test time, test cost, optimization, 3D SoC, 
 Summary | Full Text:PDF(597.2KB)
An Analysis of the Economics of the VLSI Development Including Test Cost
Koji NAKAMAE Homare SAKAMOTO Hiromu FUJIOKA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/04/25
Vol. E77-A  No. 4 ; pp. 698-705
Type of Manuscript:  PAPER
Category: Computer Aided Design (CAD)
Keyword: 
testing and verification, economics of VLSI development, test cost, VLSI development cycle, EB tester, FIB reconstruction, fault modeling, 
 Summary | Full Text:PDF(597.6KB)