Keyword : test controllers

A Test Plan Grouping Method to Shorten Test Length for RTL Data Paths under a Test Controller Area Constraint
Toshinori HOSOKAWA Hiroshi DATE Masahide MIYAZAKI Michiaki MURAOKA Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2003/12/01
Vol. E86-D  No. 12 ; pp. 2674-2683
Type of Manuscript:  Special Section PAPER (Special Issue on Dependable Computing)
Category: Test
test plan groupingtest controllerspartly compacted test plan tablesRTL data pathshierarchical test generation
 Summary | Full Text:PDF