Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2010/01/01 Vol. E93-DNo. 1 ;
pp. 17-23 Type of Manuscript: Special Section PAPER (Special Section on Test, Diagnosis and Verification of SOCs) Category: Keyword: test compression, hybrid compression, volume diagnosis, ATPG, partial good chip,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2008/03/01 Vol. E91-DNo. 3 ;
pp. 713-719 Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSIs) Category: Test Compression Keyword: test compression, ATE, reconfigurability, variable-length coding, test application,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2004/03/01 Vol. E87-DNo. 3 ;
pp. 544-550 Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI) Category: Test Generation and Compaction Keyword: test compression, don't care identification, Huffman's algorithm, test generation,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2002/10/01 Vol. E85-DNo. 10 ;
pp. 1466-1473 Type of Manuscript: Special Section PAPER (Special Issue on Test and Verification of VLSI) Category: Test Generation and Modification Keyword: VLSI test, test compression, statistical code, test generation, automatic test equipment,
