Keyword : test chip

Radiated Harmonics Characterization of CMOS Test Chip with On-Chip Decoupling Capacitance
Toshio SUDO 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2005/08/01
Vol. E88-B  No. 8 ; pp. 3195-3199
Type of Manuscript:  Special Section PAPER (Special Section of 2004 International Symposium on Electromagnetic Compatibility)
Category: Printed Circuit Boards
Keyword: 
radiated emission, on-chip decoupling capacitor, test chip, core circuit, output buffer circuit, simultaneous switching noise, 
 Summary | Full Text:PDF(1.9MB)
Substrate Coupling Simulation Suitable for Conventional CAD Tools
Tomohisa KIMURA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/02/01
Vol. E86-A  No. 2 ; pp. 419-423
Type of Manuscript:  Special Section LETTER (Special Section on Analog Circuit Techniques and Related Topics)
Category: 
Keyword: 
substrate coupling, simulation, modeling, CAD, test chip, 
 Summary | Full Text:PDF(471.3KB)