Keyword : test application time


A Novel Test Data Compression Scheme for SoCs Based on Block Merging and Compatibility
Tiebin WU Hengzhu LIU Botao ZHANG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/07/01
Vol. E97-A  No. 7 ; pp. 1452-1460
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
test data compressionblock mergingcompatibilitytest application timecode-based testingsystem-on-chip (SoC)
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Scan Shift Time Reduction Using Test Compaction for On-Chip Delay Measurement
Wenpo ZHANG Kazuteru NAMBA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2014/03/01
Vol. E97-D  No. 3 ; pp. 533-540
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
small-delay defectstest compactiontest application timetest data volumeon-chip delay measurement
 Summary | Full Text:PDF

MTR-Fill: A Simulated Annealing-Based X-Filling Technique to Reduce Test Power Dissipation for Scan-Based Designs
Dong-Sup SONG Jin-Ho AHN Tae-Jin KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/04/01
Vol. E91-D  No. 4 ; pp. 1197-1200
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
low power testscan-based testX-fillingtest application time
 Summary | Full Text:PDF

A Self-Test of Dynamically Reconfigurable Processors with Test Frames
Tomoo INOUE Takashi FUJII Hideyuki ICHIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 756-762
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: High-Level Testing
Keyword: 
dynamically reconfigurable processorsself-testoptimal contextstest application timetest frames
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A Variable-Length Coding Adjustable for Compressed Test Application
Hideyuki ICHIHARA Toshihiro OHARA Michihiro SHINTANI Tomoo INOUE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/08/01
Vol. E90-D  No. 8 ; pp. 1235-1242
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
test compressionvariable-length codingtest application timeATEHuffman codeand test environment
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Compression/Scan Co-design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time
Yu HU Yinhe HAN Xiaowei LI Huawei LI Xiaoqing WEN 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/10/01
Vol. E89-D  No. 10 ; pp. 2616-2625
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
compressionrun-length codingrandom access scanpower dissipationtest application time
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Huffman-Based Test Response Coding
Hideyuki ICHIHARA Michihiro SHINTANI Tomoo INOUE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/01/01
Vol. E88-D  No. 1 ; pp. 158-161
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
Huffman codetest compressiontest responsetest application timeATE
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Novel DFT Strategies Using Full/Partial Scan Designs and Test Point Insertion to Reduce Test Application Time
Toshinori HOSOKAWA Masayoshi YOSHIMURA Mitsuyasu OHTA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/11/01
Vol. E84-A  No. 11 ; pp. 2722-2730
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test
Keyword: 
DFT strategiesfull scan design methodspartial scan design methodstest point insertionstest application time
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Compact Test Sequences for Scan-Based Sequential Circuits
Hiroyuki HIGUCHI Kiyoharu HAMAGUCHI Shuzo YAJIMA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1993/10/25
Vol. E76-A  No. 10 ; pp. 1676-1683
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
test generationscan designtest application timeboolean function manipulation
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