Keyword : systematic yield


Introduction of Yield Quadrant and Yield Capability Index for VLSI Manufacturing
Junichi HIRASE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/06/01
Vol. E97-C  No. 6 ; pp. 609-618
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
yieldcluster parametersystematic yieldyield quadrantyield capability index
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Systematic Yield Simulation Methodology Applied to Fully-Depleted SOI MOSFET Process
Noriyuki MIURA Hirokazu HAYASHI Koichi FUKUDA Kenji NISHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2000/08/25
Vol. E83-C  No. 8 ; pp. 1288-1294
Type of Manuscript:  Special Section PAPER (Special Issue on 1999 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'99))
Category: Simulation Methodology and Environment
Keyword: 
fully-depleted SOIfloating-body effectparasitic channel leakagesystematic yieldprocess optimization
 Summary | Full Text:PDF