Keyword : synthesis for testability


Acceleration of Test Generation for Sequential Circuits Using Knowledge Obtained from Synthesis for Testability
Masato NAKAZATO Satoshi OHTAKE Kewal K. SALUJA Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/01/01
Vol. E90-D  No. 1 ; pp. 296-305
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
sequential circuittest generationsynthesis for testabilityfinite state machinetest knowledge
 Summary | Full Text:PDF(641.6KB)

Classification of Sequential Circuits Based on τk Notation and Its Applications
Chia Yee OOI Thomas CLOUQUEUR Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/12/01
Vol. E88-D  No. 12 ; pp. 2738-2747
Type of Manuscript:  PAPER
Category: VLSI Systems
Keyword: 
test generationeasily testable sequential circuitscomplexitydesign for testabilitysynthesis for testability
 Summary | Full Text:PDF(391.4KB)

Synthesis for Testability of Synchronous Sequential Circuits with Strong-Connectivity Using Undefined States on State Transition Graph
Soo-Hyun KIM Ho-Yong CHOI Kiseon KIM Dong-Ik LEE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/12/01
Vol. E87-A  No. 12 ; pp. 3216-3223
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test
Keyword: 
synthesis for testabilityundefined statesredundant faults
 Summary | Full Text:PDF(231.1KB)

Sequential Redundancy Removal Using Test Generation and Multiple Strongly Unreachable States
Hiroyuki YOTSUYANAGI Masaki HASHIZUME Takeomi TAMESADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10 ; pp. 1605-1608
Type of Manuscript:  Special Section LETTER (Special Issue on Test and Verification of VLSI)
Category: 
Keyword: 
synthesis for testabilityredundancy removalsequential circuitundetectable faultsunreachable states
 Summary | Full Text:PDF(220.4KB)