Keyword : surface defect inspection

Surface Defect Inspection of Cold Rolled Strips with Features Based on Adaptive Wavelet Packets
Chang Su LEE Chong-Ho CHOI Young CHOI Se Ho CHOI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1997/05/25
Vol. E80-D  No. 5 ; pp. 594-604
Type of Manuscript:  PAPER
Category: Image Processing,Computer Graphics and Pattern Recognition
surface defect inspectionwavelet packetquadtreesubband decompositionneural network
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