Keyword : supply current test


Lead Open Detection Based on Supply Current of CMOS LSIs
Masao TAKAGI Masaki HASHIZUME Masahiro ICHIMIYA Hiroyuki YOTSUYANAGI Takeomi TAMESADA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/06/01
Vol. E87-A  No. 6 ; pp. 1330-1337
Type of Manuscript:  Special Section PAPER (Special Section on Papers Selected from 2003 International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2003))
Category: 
Keyword: 
lead openCMOS LSIsupply current testelectric field
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Test Sequence Generation for Test Time Reduction of IDDQ Testing
Hiroyuki YOTSUYANAGI Masaki HASHIZUME Takeomi TAMESADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3 ; pp. 537-543
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Test Generation and Compaction
Keyword: 
IDDQ testingbridging faultsswitching currentsupply current testCMOS circuits
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Test Pattern Generation for CMOS Open Defect Detection by Supply Current Testing under AC Electric Field
Hiroyuki YOTSUYANAGI Taisuke IWAKIRI Masaki HASHIZUME Takeomi TAMESADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2003/12/01
Vol. E86-D  No. 12 ; pp. 2666-2673
Type of Manuscript:  Special Section PAPER (Special Issue on Dependable Computing)
Category: Test
Keyword: 
open defectssupply current testCMOS circuitselectric field
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CMOS Open Defect Detection by Supply Current Measurement under Time-Variable Electric Field Supply
Masaki HASHIZUME Masahiro ICHIMIYA Hiroyuki YOTSUYANAGI Takeomi TAMESADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10 ; pp. 1542-1550
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: Current Test
Keyword: 
open defectCMOSsupply current testelectric field
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