Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2006/03/01
Vol. E89-C
No. 3 ;
pp. 300-313
Type of Manuscript:
INVITED PAPER (Special Section on VLSI Design Technology in the Sub-100 nm Era)
Category:
Keyword:
CMOS, high-speed I/O, interface, sub-100 nm, |
