Keyword : stuck-at faults


Analysis of Test Generation Complexity for Stuck-At and Path Delay Faults Based on τk-Notation
Chia Yee OOI Thomas CLOUQUEUR Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/08/01
Vol. E90-D  No. 8 ; pp. 1202-1212
Type of Manuscript:  PAPER
Category: Complexity Theory
Keyword: 
easily testablestuck-at faultspath delay faultstest generation complexity
 Summary | Full Text:PDF(367.4KB)

On a Weight Limit Approach for Enhancing Fault Tolerance of Feedforward Neural Networks
Naotake KAMIURA Teijiro ISOKAWA Yutaka HATA Nobuyuki MATSUI Kazuharu YAMATO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/11/25
Vol. E83-D  No. 11 ; pp. 1931-1939
Type of Manuscript:  PAPER
Category: Fault Tolerance
Keyword: 
feedforward neural networksfault tolerancebackpropagation algorithmstuck-at faultsgeneralization ability
 Summary | Full Text:PDF(19.1MB)