Keyword : stress-induced capacitance


Stress-Induced Capacitance of Partially Depleted MOSFETs from Ring Oscillator Delay
Wen-Teng CHANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/05/01
Vol. E95-C  No. 5 ; pp. 802-806
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
Partially depleted MOSFETstrained channelpiezoresistance coefficientring oscillatorstress-induced capacitance
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