Keyword : stress probability


Stress Probability Computation for Estimating NBTI-Induced Delay Degradation
Hiroaki KONOURA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2011/12/01
Vol. E94-A  No. 12 ; pp. 2545-2553
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword: 
NBTIstress probabilitytiming analysis
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Short Term Cell-Flipping Technique for Mitigating SNM Degradation Due to NBTI
Yuji KUNITAKE Toshinori SATO Hiroto YASUURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/04/01
Vol. E94-C  No. 4 ; pp. 520-529
Type of Manuscript:  Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category: 
Keyword: 
NBTISRAMstatic noise marginstress probabilityregister filecache memory
 Summary | Full Text:PDF