Keyword : stress analysis

Mechanical Stress Simulation for Highly Reliable Deep-Submicron Devices
Hideo MIURA Shuji IKEDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/06/25
Vol. E82-C  No. 6 ; pp. 830-838
Type of Manuscript:  INVITED PAPER (Special Issue on TCAD for Semiconductor Industries)
semiconductortransistorresidual stressstress analysisstress measurement
 Summary | Full Text:PDF(637.2KB)

Design of Polarization-Maintaining Optical Fiber Suitable for Thermally-Diffused Expanded Core Techniques
Hirohisa YOKOTA Emiko OKITSU Yutaka SASAKI 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 1997/04/25
Vol. E80-B  No. 4 ; pp. 516-521
Type of Manuscript:  Special Section PAPER (Special Issue on Optical Fibers and Their Applications)
polarization-maintaining fiberTEC fiberstress analysisbeam propagation method
 Summary | Full Text:PDF(473.2KB)