Keyword : statistical machine learning

Bayesian Estimation of Multi-Trap RTN Parameters Using Markov Chain Monte Carlo Method
Hiromitsu AWANO Hiroshi TSUTSUI Hiroyuki OCHI Takashi SATO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2012/12/01
Vol. E95-A  No. 12 ; pp. 2272-2283
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
random telegraph noiseBayesian estimationMarkov chain Monte Carlodevice characterizationsource separationstatistical machine learning
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