Keyword : statistical leakage current analysis

IDDQ Outlier Screening through Two-Phase Approach: Clustering-Based Filtering and Estimation-Based Current-Threshold Determination
Michihiro SHINTANI Takashi SATO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2014/08/01
Vol. E97-D  No. 8 ; pp. 2095-2104
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
IDDQ testing, k-means clustering, statistical leakage current analysis, Bayes' theorem, simulated annealing, 
 Summary | Full Text:PDF
Device-Parameter Estimation through IDDQ Signatures
Michihiro SHINTANI Takashi SATO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/02/01
Vol. E96-D  No. 2 ; pp. 303-313
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
IDDQ testing, statistical leakage current analysis, Bayes' theorem, 
 Summary | Full Text:PDF