Keyword : spurious noise


Reduction of Charge Injection and Current-Mismatch Errors of Charge Pump for Phase-Locked Loop
Masahiro YOSHIOKA Nobuo FUJII 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/02/01
Vol. E92-A  No. 2 ; pp. 381-388
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
Category: 
Keyword: 
charge pumpcharge injectioncurrent-mismatchspurious noisephase-locked loop
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