Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2009/07/01 Vol. E92-ANo. 7 ;
pp. 1652-1659 Type of Manuscript: PAPER Category: VLSI Design Technology and CAD Keyword: intra-die variations, spatial correlation, correlation function, spectral density,
Model for Thermal Noise in Semiconductor Bipolar Transistors at Low-Current Operation as Multidimensional Diffusion Stochastic Process Yevgeny V.MAMONTOVMagnus WILLANDER