Keyword : spare gate


Dynamic Fault Tree Analysis Using Bayesian Networks and Sequence Probabilities
Tetsushi YUGE Shigeru YANAGI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2013/05/01
Vol. E96-A  No. 5 ; pp. 953-962
Type of Manuscript:  PAPER
Category: Reliability, Maintainability and Safety Analysis
Keyword: 
dynamic fault treeBayesian networksspare gatesequence probability
 Summary | Full Text:PDF(493.2KB)