Keyword : source edge


Study on Impurity Distribution Dependence of Electron-Dynamics in Vertical MOSFET
Masakazu MURAGUCHI Tetsuo ENDOH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/05/01
Vol. E94-C  No. 5 ; pp. 737-742
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
vertical MOSFETquantum electron dynamicsimpuritytime-dependent schrodinger equationsource edge
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