Keyword : soft errors


A Fault-Tolerant Architecture with Error Correcting Code for the Instruction-Level Temporal Redundancy
Chao YAN Hongjun DAI Tianzhou CHEN 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2012/01/01
Vol. E95-D  No. 1 ; pp. 38-45
Type of Manuscript:  Special Section PAPER (Special Section on Trust, Security and Privacy in Computing and Communication Systems)
Category: Trust
Keyword: 
soft errorsfault tolerancedouble executioninstruction reuse bufferfast error correcting code
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Ultra Dependable Processor
Shuichi SAKAI Masahiro GOSHIMA Hidetsugu IRIE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/09/01
Vol. E91-C  No. 9 ; pp. 1386-1393
Type of Manuscript:  INVITED PAPER (Special Section on Advanced Processors Based on Novel Concepts in Computation)
Category: 
Keyword: 
microprocessor architecturedependable computingattacksfaultserrorsfailuressoft errorstiming errorstamper resistanceinformation flowinjection attackdependability manager
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Temperature Dependence of Single Event Charge Collection in SOI MOSFETs by Simulation Approach
Tsukasa OOOKA Hideyuki IWATA Takashi OHZONE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/03/25
Vol. E80-C  No. 3 ; pp. 417-422
Type of Manuscript:  Special Section PAPER (Special Issue on SOI Devices and Their Process Technologies)
Category: 
Keyword: 
SOI MOSFETsnumerical simulationtemperature dependencesingle event upsetsoft errors
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Theoretical Study of Alpha-Particle-lnduced Soft Errors in Submicron SOI SRAM
Yoshiharu TOSAKA Kunihiro SUZUKI Shigeo SATOH Toshihiro SUGII 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/06/25
Vol. E79-C  No. 6 ; pp. 767-771
Type of Manuscript:  Special Section PAPER (Special Issue on ULSI Memory Technology)
Category: Static RAMs
Keyword: 
soft errorsSOI SRAM, α-particle-induced bipolar currentcritical α-particle-induced initial chargesoft error rate
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