| Keyword : soft error
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A Low-Power Radiation-Hardened Flip-Flop with Stacked Transistors in a 65 nm FDSOI Process Haruki MARUOKA Masashi HIFUMI Jun FURUTA Kazutoshi KOBAYASHI | Publication:
Publication Date: 2018/04/01
Vol. E101-C
No. 4 ;
pp. 273-280
Type of Manuscript:
Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)
Category: Keyword: single event effect, soft error, α particle, neutron, heavy ion, FDSOI, flip-flop, low-power consumption, | | Summary | Full Text:PDF | |
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Reliability Evaluation Environment for Exploring Design Space of Coarse-Grained Reconfigurable Architectures Takashi IMAGAWA Masayuki HIROMOTO Hiroyuki OCHI Takashi SATO | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/12/01
Vol. E93-A
No. 12 ;
pp. 2524-2532
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: High-Level Synthesis and System-Level Design Keyword: soft error, TMR, reliability, methodology, | | Summary | Full Text:PDF | |
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Reliability Inherent in Heterogeneous Multiprocessor Systems and Task Scheduling for Ameliorating Their Reliability Makoto SUGIHARA | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/04/01
Vol. E92-A
No. 4 ;
pp. 1121-1128
Type of Manuscript:
Special Section PAPER (Special Section on Advanced Technologies Emerging Mainly from the 21st Workshop on Circuits and Systems in Karuizawa)
Category: Keyword: soft error, single event upset, reliability, task scheduling, heterogeneous multiprocessor systems, | | Summary | Full Text:PDF | |
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Minority Carrier Collection in 256 M-bit DRAM Cell on Incidence of Alpha-Particle Analyzed by Three-Dimensional Device Simulation Sumiko OSHIDA Masao TAGUCHI | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 1993/11/25
Vol. E76-C
No. 11 ;
pp. 1604-1610
Type of Manuscript:
Special Section PAPER (Special Issue on LSI Memories)
Category: DRAM Keyword: soft error, device simulation, 256 M-bit DRAM, | | Summary | Full Text:PDF | |
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