Keyword : small delay defects


Design for Delay Measurement Aimed at Detecting Small Delay Defects on Global Routing Resources in FPGA
Kazuteru NAMBA Nobuhide TAKASHINA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/08/01
Vol. E96-D  No. 8 ; pp. 1613-1623
Type of Manuscript:  Special Section PAPER (Special Section on Reconfigurable Systems)
Category: Test and Verification
Keyword: 
small delay defectsdelay measurementDVMC (delay value measurement circuit)FPGA (field programmable gate array)global routing resource
 Summary | Full Text:PDF(917KB)

Test Pattern Ordering and Selection for High Quality Test Set under Constraints
Michiko INOUE Akira TAKETANI Tomokazu YONEDA Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2012/12/01
Vol. E95-D  No. 12 ; pp. 3001-3009
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
small delay defectsSDQLATPG
 Summary | Full Text:PDF(850.8KB)