Keyword : single stuck-at fault


Proposal of Testable Multi-Context FPGA Architecture
Kazuteru NAMBA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/05/01
Vol. E89-D  No. 5 ; pp. 1687-1693
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
multi-context FPGAsingle stuck-at faultdesign for testability
 Summary | Full Text:PDF

Easily Testable Realization Based on Single-Rail-Input OR-AND-EXOR Expressions
Takashi HIRAYAMA Goro KODA Yasuaki NISHITANI Kensuke SHIMIZU 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1999/09/25
Vol. E82-D  No. 9 ; pp. 1278-1286
Type of Manuscript:  PAPER
Category: Fault Tolerant Computing
Keyword: 
logic synthesisexclusive-orsingle stuck-at faulteasily testable realization
 Summary | Full Text:PDF