Keyword : silicon


High Speed and High Responsivity Avalanche Photodiode Fabricated by Standard CMOS Process in Blue Wavelength Region
Koichi IIYAMA Takeo MARUYAMA Ryoichi GYOBU Takuya HISHIKI Toshiyuki SHIMOTORI 
Publication:   
Publication Date: 2018/07/01
Vol. E101-C  No. 7 ; pp. 574-580
Type of Manuscript:  INVITED PAPER (Special Section on Distinguished Papers in Photonics)
Category: 
Keyword: 
siliconphotodiodeavalanche photodiodeCMOSblu-ray
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Characterizing Silicon Avalanche Photodiode Fabricated by Standard 0.18µm CMOS Process for High-Speed Operation
Zul Atfyi Fauzan Mohammed NAPIAH Ryoichi GYOBU Takuya HISHIKI Takeo MARUYAMA Koichi IIYAMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/12/01
Vol. E99-C  No. 12 ; pp. 1304-1311
Type of Manuscript:  PAPER
Category: Lasers, Quantum Electronics
Keyword: 
photodiodeavalanche photodiodeCMOS processsilicon
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Single-Grain Si Thin-Film Transistors for Monolithic 3D-ICs and Flexible Electronics
Ryoichi ISHIHARA Jin ZHANG Miki TRIFUNOVIC Jaber DERAKHSHANDEH Negin GOLSHANI Daniel M. R. TAJARI MOFRAD Tao CHEN Kees BEENAKKER Tatsuya SHIMODA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/04/01
Vol. E97-C  No. 4 ; pp. 227-237
Type of Manuscript:  INVITED PAPER (Special Section on Solid-State Circuit Design,---,Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
siliconthin-film transistor3D-ICsexcimer-lasercrystallizationSRAMimage sensorflexible electronics
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Enhancement of Light Emission from Silicon by Utilizing Photonic Nanostructures
Satoshi IWAMOTO Yasuhiko ARAKAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/02/01
Vol. E95-C  No. 2 ; pp. 206-212
Type of Manuscript:  INVITED PAPER (Special Section on Photonic Devices using Nanofabrication Technology and Their Applications)
Category: 
Keyword: 
photonic nanostructuresphotonic crystalsnanocavityPurell effectsiliconlight emissionLED
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Silicon Mach-Zehnder Waveguide Interferometer on Silicon-on-Silicon (SOS) Substrate Incorporating the Integrated Three-Terminal Field-Effect Device as an Optical Signal Modulation Structure
Ricky W. CHUANG Mao-Teng HSU Shen-Horng CHOU Yao-Jen LEE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/07/01
Vol. E94-C  No. 7 ; pp. 1173-1178
Type of Manuscript:  Special Section PAPER (Joint Special Section on Opto-electronics and Communications for Future Optical Network)
Category: 
Keyword: 
carrier injectionspreading resistance probe (SRP)modulation depthspin-on-dopants (SOD)siliconfield-effect transistorand modulator
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Polymorphous Silicon: A Promising Material for Thin-Film Transistors for Low-Cost and High-Performance Active-Matrix OLED Displays
Francois TEMPLIER Julien BROCHET Bernard AVENTURIER David COOPER Alexey ABRAMOV Dmitri DAINEKA Pere ROCA i CABARROCAS 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/10/01
Vol. E93-C  No. 10 ; pp. 1490-1494
Type of Manuscript:  INVITED PAPER (Special Section on Frontier of Thin-Film Transistor Technology)
Category: 
Keyword: 
thin-film transistorspolymorphoussiliconOLED
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Micromachined RF Devices for Concurrent Integration on Dielectric-Air-Metal Structures
Tamotsu NISHINO Masatake HANGAI Yukihisa YOSHIDA Sang-Seok LEE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/07/01
Vol. E93-C  No. 7 ; pp. 1111-1118
Type of Manuscript:  Special Section PAPER (Special Section on Recent Progress in Microwave and Millimeter-Wave Technologies)
Category: 
Keyword: 
micromachineMEMShollow waveguidesGCPWfiltershybridsMEMS switchessilicon
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Analog Pre-Distortion Linearizer Using Self Base Bias Controlled Amplifier
Shintaro SHINJO Kazutomi MORI Keiki YAMADA Noriharu SUEMATSU Mitsuhiro SHIMOZAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/07/01
Vol. E93-C  No. 7 ; pp. 966-974
Type of Manuscript:  Special Section PAPER (Special Section on Recent Progress in Microwave and Millimeter-Wave Technologies)
Category: 
Keyword: 
distortionenvelopelinearizermicrowavepower amplifiersilicon
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A Flexible Microwave De-Embedding Method for On-Wafer Noise Parameter Characterization of MOSFETs
Yueh-Hua WANG Ming-Hsiang CHO Lin-Kun WU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/09/01
Vol. E92-C  No. 9 ; pp. 1157-1162
Type of Manuscript:  Special Section PAPER (Special Section on Recent Progress in Microwave and Millimeter-Wave Technologies and Their Applications)
Category: 
Keyword: 
de-embeddingmicrowaveMOSFETsnoiseRFsilicon
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Avalanche Amplification in Silicon Lateral Photodiode Fabricated by Standard 0.18 µm CMOS Process
Koichi IIYAMA Noriaki SANNOU Hideki TAKAMATSU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/11/01
Vol. E91-C  No. 11 ; pp. 1820-1823
Type of Manuscript:  LETTER
Category: Lasers, Quantum Electronics
Keyword: 
photodiodesiliconCMOS processavalanche gain
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The Impact of Silicon Photonics
Richard SOREF 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/02/01
Vol. E91-C  No. 2 ; pp. 129-130
Type of Manuscript:  INVITED PAPER (Special Section on Silicon Photonics Technologies and Their Applications)
Category: 
Keyword: 
siliconoptoelectronicsintegrated photonics
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Enabling Light Emission from Si Based MOSLED on Surface Nano-Roughened Si Substrate
Gong-Ru LIN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/02/01
Vol. E91-C  No. 2 ; pp. 173-180
Type of Manuscript:  INVITED PAPER (Special Section on Silicon Photonics Technologies and Their Applications)
Category: 
Keyword: 
Si-ion-implantationPECVDnanocrystalsiliconSi-rich SiOxnano-pyramidsnano-pillarsMOSLEDelectroluminescenceFowler-Nordheim tunneling
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A Cascade Open-Short-Thru (COST) De-Embedding Method for Microwave On-Wafer Characterization and Automatic Measurement
Ming-Hsiang CHO Guo-Wei HUANG Chia-Sung CHIU Kun-Ming CHEN An-Sam PENG Yu-Min TENG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5 ; pp. 845-850
Type of Manuscript:  Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
automatic measurementcascade configurationon-wafer de-embeddingsiliconS-parameters
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In-Advance CPU Time Analysis for Stationary Monte Carlo Device Simulations
Christoph JUNGEMANN Bernd MEINERZHAGEN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/03/01
Vol. E86-C  No. 3 ; pp. 314-319
Type of Manuscript:  Special Section PAPER (Special Issue on the 2002 IEEE International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'02))
Category: 
Keyword: 
siliconnoisedrift-diffusionhydrodynamicMonte Carlo
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The Process Modeling Hierarchy: Connecting Atomistic Calculations to Nanoscale Behavior
Scott T. DUNHAM Pavel FASTENKO Zudian QIN Milan DIEBEL 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/03/01
Vol. E86-C  No. 3 ; pp. 276-283
Type of Manuscript:  INVITED PAPER (Special Issue on the 2002 IEEE International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'02))
Category: 
Keyword: 
atomisticdiffusionactivationdoping fluctuationssilicon
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Three-Dimensional MMIC Technology on Silicon: Review and Recent Advances
Belinda PIERNAS Kenjiro NISHIKAWA Kenji KAMOGAWA Ichihiko TOYODA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/07/01
Vol. E85-C  No. 7 ; pp. 1394-1403
Type of Manuscript:  INVITED PAPER (Special Issue on Silicon RF Device & Integrated Circuit Technologies)
Category: 
Keyword: 
three-dimensionalMMICsiliconmasterslicesingle-chip transceiver
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Silicon Planar Esaki Diode Operating at Room Temperature
Junji KOGA Akira TORIUMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/08/01
Vol. E84-C  No. 8 ; pp. 1051-1055
Type of Manuscript:  Special Section PAPER (Special Issue on Silicon Nanodevices)
Category: 
Keyword: 
planar Esaki diodesiliconinterband tunnel effectnegative differential conductancephonon-assisted tunneling
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3-Dimensional Process Simulation of Thermal Annealing of Low Dose Implanted Dopants in Silicon
Vincent SENEZ Jerome HERBAUX Thomas HOFFMANN Evelyne LAMPIN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2000/08/25
Vol. E83-C  No. 8 ; pp. 1267-1274
Type of Manuscript:  Special Section PAPER (Special Issue on 1999 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'99))
Category: Process Modeling and Simulation
Keyword: 
diffusionfinite elementthree-dimensionalgear schemepoint-defectssilicon
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Efficient Full-Band Monte Carlo Simulation of Silicon Devices
Christoph JUNGEMANN Stefan KEITH Martin BARTELS Bernd MEINERZHAGEN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/06/25
Vol. E82-C  No. 6 ; pp. 870-879
Type of Manuscript:  INVITED PAPER (Special Issue on TCAD for Semiconductor Industries)
Category: 
Keyword: 
siliconfull-band Monte Carlomicroscopic relaxation timevelocity overshootimpact ionizationdrift-diffusiondeep submicron NMOSFET
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Modeling of Dopant Diffusion in Silicon
Scott T. DUNHAM Alp H. GENCER Srinivasan CHAKRAVARTHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/06/25
Vol. E82-C  No. 6 ; pp. 800-812
Type of Manuscript:  INVITED PAPER (Special Issue on TCAD for Semiconductor Industries)
Category: 
Keyword: 
dopant diffusionpoint defectssiliconinterstitialvacancydopant/defect pairingcoupled diffusionpair diffusiondiffusivityequilibrium concentrationmetal diffusionlattice Monte Carlo
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Fabrication of Silicon Quantum Wires and Dots
Yoshihiko HIRAI Kiyoshi MORIMOTO Masaaki NIWA Koichiro YUKI Juro YASUI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/09/25
Vol. E77-C  No. 9 ; pp. 1426-1430
Type of Manuscript:  Special Section PAPER (Special Issue on Heterostructure Devices and Epitaxial Growth Techniques)
Category: 
Keyword: 
siliconquantum wirequantum dotanisotropic etching
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Highly Reliable Flash Memories Fabricated by in-situ Multiple Rapid Thermal Processing
Takahisa HAYASHI Yoshiyuki KAWAZU Akira UCHIYAMA Hisashi FUKUDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/08/25
Vol. E77-C  No. 8 ; pp. 1270-1278
Type of Manuscript:  Special Section PAPER (Special Section on High Speed and High Density Multi Functional LSI Memories)
Category: Non-volatile Memory
Keyword: 
electrically erasable programmable read-only memorymetal-oxide-semiconductor structuressiliconinsulating materials and insulatorspolysilicon
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Evaluation of Two-Dimensional Transient Enhanced Diffusion of Phosphorus during Shallow Junction Formation
Hisako SATO Katsumi TSUNENO Hiroo MASUDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/02/25
Vol. E77-C  No. 2 ; pp. 106-111
Type of Manuscript:  Special Section PAPER (Special Issue on 1993 VLSI Process and Device Modeling Workshop (VPAD 93))
Category: Process Simulation
Keyword: 
transient enhanced diffusiontwo-dimensionphosphorussiliconshallow junctionfurnace annealing
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Initial Stage of SiO2/Si Interface Formation on Si(111) Surface
Hiroshi NOHIRA Yoshinari TAMURA Hiroki OGAWA Takeo HATTORI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/07/25
Vol. E75-C  No. 7 ; pp. 757-763
Type of Manuscript:  Special Section PAPER (Special Issue on Ultra Clean Technology)
Category: 
Keyword: 
oxidationsiliconH-terminationXPS
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Chemical Structures of Native Oxides Formed during Wet Chemical Treatments of Silicon Surfaces
Hiroki OGAWA Takeo HATTORI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/07/25
Vol. E75-C  No. 7 ; pp. 774-780
Type of Manuscript:  Special Section PAPER (Special Issue on Ultra Clean Technology)
Category: 
Keyword: 
chemical structuresiliconnative oxideH-terminationXPS
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Reaction of H-Terminated Si(100) Surfaces with Oxidizer in the Heating and Cooling Process
Norikuni YABUMOTO Yukio KOMINE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/07/25
Vol. E75-C  No. 7 ; pp. 770-773
Type of Manuscript:  Special Section PAPER (Special Issue on Ultra Clean Technology)
Category: 
Keyword: 
siliconsurfaceoxidationhydrogen-terminationthermal desorption spectroscopy
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1/5 Power Law in PN-Junction Failure Mechanism Caused by Electrical-Over-Stress
Yutaka TAJIMA Kunihiro ASADA Takuo SUGANO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/02/25
Vol. E75-C  No. 2 ; pp. 207-215
Type of Manuscript:  Special Section PAPER (Special Issue on Selected Papers from '91 VPAD)
Category: 
Keyword: 
reliabilityfailurepn-junctionsiliconelectrostatic-discharge
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