| Keyword : signal transition graph
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Test Generation for SI Asynchronous Circuits with Undetectable Faults from Signal Transition Graph Specification Eunjung OH Jeong-Gun LEE Dong-Ik LEE Ho-Yong CHOI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/06/01
Vol. E84-A
No. 6 ;
pp. 1506-1514
Type of Manuscript:
Special Section PAPER (Special Section on Papers Selected from 2000 International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2000))
Category: Keyword: ATPG, SI asynchronous circuits, signal transition graph, testing, | | Summary | Full Text:PDF(777.7KB) | |
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