Keyword : shot noise


Shot Noise Modeling in Metal-Oxide-Semiconductor Field Effect Transistors under Sub-Threshold Condition
Yoshioki ISOBE Kiyohito HARA Dondee NAVARRO Youichi TAKEDA Tatsuya EZAKI Mitiko MIURA-MATTAUSCH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/04/01
Vol. E90-C  No. 4 ; pp. 885-894
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETshot noisehigh frequency noisedevice simulationsub-threshold current
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Local Maxima Error Intensity Functions and Its Application to Time Delay Estimator in the Presence of Shot Noise Interference
Joong-Kyu KIM 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2000/09/25
Vol. E83-A  No. 9 ; pp. 1844-1852
Type of Manuscript:  PAPER
Category: General Fundamentals and Boundaries
Keyword: 
error intensity functionlocal maximaM-estimatortime delayshot noise
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Increasing Importance of Electronic Thermal Noise in Sub-0.1 µm Si-MOSFETs
Nobuyuki SANO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2000/08/25
Vol. E83-C  No. 8 ; pp. 1203-1211
Type of Manuscript:  INVITED PAPER (Special Issue on 1999 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'99))
Category: Device Modeling and Simulation
Keyword: 
Monte Carlo simulationcurrent fluctuationthermal noiseshot noisecentral limit theorem
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Highly Sensitive Real Time Electro-Optic Probing for Long Logic Pattern Analysis
Hironori TAKAHASHI Shin-ichiro AOSHIMA Kazuhiko WAKAMORI Isuke HIRANO Yutaka TSUCHIYA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/01/25
Vol. E78-C  No. 1 ; pp. 67-72
Type of Manuscript:  Special Section PAPER (Special Issue on Ultrafast Optoelectronics)
Category: 
Keyword: 
electro-optic probingreal time measurementvoltage sensitivitynoise in electro-optic probingshot noise
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