IEICE Trans

Keyword : semiconductor

Automatic Defect Classification System in Semiconductors EDS Test Based on System Entity Structure Methodology Young-Shin HAN SoYoung KIM TaeKyu KIM Jason J. JUNG
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2010/07/01 Vol. E93-D No. 7 ; pp. 2001-2004 Type of Manuscript: LETTER Category: Artificial Intelligence, Data Mining Keyword: semiconductor, system entity structure, electrical die sorting, fail bit map data, pruning,
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Design of Gear-Form Cathode as a Removal Modusof Optical Materials of Indium-Tin-Oxide Pai-Shan PA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2009/11/01 Vol. E92-C No. 11 ; pp. 1358-1361 Type of Manuscript: BRIEF PAPER Category: Keyword: gear-form cathode, Indium-Tin-Oxide, semiconductor, nanostructure crystallization,
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Low Driving Voltage 40 Gbit/s n-i-n Mach-Zehnder Modulator Fabricated on InP Substrate Ken TSUZUKI Tadao ISHIBASHI Hiroshi YASAKA Yuichi TOHMORI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2005/05/01 Vol. E88-C No. 5 ; pp. 960-966 Type of Manuscript: Special Section PAPER (Joint Special Section on Recent Progress in Optoelectronics and Communications) Category: Optical Active Devices and Modules Keyword: Mach-Zehnder, modulator, InP, n-i-n, semiconductor,
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Design and Development of 3-Dimensional Process Simulator Tetsunori WADA Norihiko KOTANI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1999/06/25 Vol. E82-C No. 6 ; pp. 839-847 Type of Manuscript: INVITED PAPER (Special Issue on TCAD for Semiconductor Industries) Category: Keyword: semiconductor, process simulator, design, file format,
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Mechanical Stress Simulation for Highly Reliable Deep-Submicron Devices Hideo MIURA Shuji IKEDA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1999/06/25 Vol. E82-C No. 6 ; pp. 830-838 Type of Manuscript: INVITED PAPER (Special Issue on TCAD for Semiconductor Industries) Category: Keyword: semiconductor, transistor, residual stress, stress analysis, stress measurement,
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Gb/s-Range Semiconductor and Ti:LiNbO₃ Guided-Wave Optical Modulators. Keiro KOMATSU Rangaraj MADABHUSHI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/01/25 Vol. E79-C No. 1 ; pp. 3-13 Type of Manuscript: INVITED PAPER (Special Issue on Optomicrowave Techniques and Their Applications) Category: Optomicrowave Devices Keyword: optical modulators, waveguide, semiconductor, LinbO₃, optical communication systems,
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Defect Detection of Passivation Layer by a Bias-Free Cu Decoration Method Tetsuaki WADA Shinji NAKANO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1994/04/25 Vol. E77-C No. 4 ; pp. 585-589 Type of Manuscript: Special Section PAPER (Special Issue on LSI Failure Analysis) Category: Keyword: semiconductor, passivation, defect, reliability, humidity test,
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Barrier Metal Effect on Electro- and Stress-Migration Tetsuaki WADA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1994/01/25 Vol. E77-A No. 1 ; pp. 180-186 Type of Manuscript: Special Section PAPER (Special Section on Reliability) Category: Failure Physics and Failure Analysis Keyword: semiconductor, metal, barrier metal, reliability electromigration, stress-migration,
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Multiple-Phase-Shift Super Structure Grating DBR Lasers Hiroyuki ISHII Yuichi TOHMORI Fumiyoshi KANO Yuzo YOSHIKUNI Yasuhiro KONDO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1993/11/25 Vol. E76-C No. 11 ; pp. 1683-1690 Type of Manuscript: PAPER Category: Opto-Electronics Keyword: semiconductor, laser diode, distributed Bragg reflector, wavelength tuning,
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Design of Ultrawide-Band, High-Sensitivity p-i-n Protodetectors Kazutoshi KATO Susumu HATA Kenji KAWANO Atsuo KOZEN
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1993/02/25 Vol. E76-C No. 2 ; pp. 214-221 Type of Manuscript: Special Section PAPER (Special Issue on Optical/Microwave Interaction Devices, Circuits and Systems) Category: Optical/Microwave Devices Keyword: p-i-n photodetector, semiconductor, microwave, multimode waveguide,
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Semiconductor Optical Modulator by Using Electron Depleting Absorption Control Minoru YAMADA Kazuhiro NODA Yuji KUWAMURA Hirohumi NAKANISHI Kiyohumi IMAI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1992/09/25 Vol. E75-C No. 9 ; pp. 1063-1070 Type of Manuscript: PAPER Category: Opto-Electronics Keyword: optical modulator, optical switch, semiconductor,
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Contamination Control in Low-Pressure Process Equipment Koichi TSUZUKI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1992/07/25 Vol. E75-C No. 7 ; pp. 860-865 Type of Manuscript: Special Section PAPER (Special Issue on Ultra Clean Technology) Category: Keyword: particulate contamination, semiconductor, low-pressure processing, particle dynamics,
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