Keyword : self-test


A Self-Test of Dynamically Reconfigurable Processors with Test Frames
Tomoo INOUE Takashi FUJII Hideyuki ICHIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 756-762
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: High-Level Testing
Keyword: 
dynamically reconfigurable processorsself-testoptimal contextstest application timetest frames
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