Keyword : self-aligned bipolar transistor


Test Structure and Experimental Analysis of Emitter-Base Reverse Voltage Stress Degradation in Self-Aligned Bipolar Transistors
Hiromi SHIMAMOTO Masamichi TANABE Takahiro ONAI Katsuyoshi WASHIO Tohru NAKAMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/02/25
Vol. E79-C  No. 2 ; pp. 211-218
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: Reliability Analysis
Keyword: 
self-aligned bipolar transistorhot-carrieremitter-base reverse voltage stress
 Summary | Full Text:PDF

Simplified Distribution Base Resistance Model in Self-Aligned Bipolar Transistors
Masamichi TANABE Hiromi SHIMAMOTO Takahiro ONAI Katsuyoshi WASHIO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/02/25
Vol. E79-C  No. 2 ; pp. 165-171
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: Device and Circuit Characterization
Keyword: 
self-aligned bipolar transistorbase resistanceparasitic base resistancespreading resistance
 Summary | Full Text:PDF